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Project

(Future IEC 60747-14-6): Semiconductor devices - Discrete Devices - Part 14-6: Semiconductor sensors Test method of CMOS imagesensor module

Begin

2006-03-31

Planned document number

IEC 47E/299/NP

Responsible national committee

DKE/UK 631.1 - Einzel-Halbleiterbauelemente  

Responsible international committee

IEC/SC 47E - Discrete semiconductor devices  

Contact

Elena Rongen

Merianstr. 28
63069 Offenbach am Main

Tel.: +49 69 6308-429

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