Integrated circuits - Measurement of impulse immunity - Part 2: Fast Impulse Injection method (IEC 47A/730/CD:2005)
Abstract
In this document, the general information and definitions on the test method to evaluate the immunity of integrated circuits (ICs) against fast conducted impulsive disturbances. This information is followed by a description of measurement conditions, test equipment and test set-up as well as the test procedures and the requirements on the content of the test report.
Begin
2003-11-28
Planned document number
IEC 47A/730/CD
Responsible national committee
DKE/K 631 - Halbleiterbauelemente