Project
IEC 60749-28 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing Direct contact charged device model (DC-CDM)
Abstract
The project prescribes charged device model elctrostatic discharge test method to evaluate sensitivity of integrated circuits to electrostatic discharges that such integrated circuits are exposed to before they are installed in elctronic equipment.
Begin
2012-03-02
Planned document number
IEC 47/2155/CDV
Responsible national committee
DKE/K 631 - Halbleiterbauelemente
