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Project

Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors

Abstract

This part of IEC 60747 specifies the performance test methods for CMOS imager-based gas sensors. It includes the terms and definitions, test environmental condition, test system, test method, and test report. This document is applicable to the performance test of both CMOS gas sensors based on lens-free imaging and CMOS gas sensors based on lens imaging.

Begin

2024-04-30

Planned document number

DIN EN IEC 60747-14-12

Project number

02232243

Responsible national committee

DKE/UK 631.1 - Einzel-Halbleiterbauelemente  

Contact

Elena Rongen

Merianstr. 28
63069 Offenbach am Main

Tel.: +49 69 6308-429

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