Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method (IEC 46F/672/CDV:2024); German and English version prEN IEC 63185:2024
Abstract
This document relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes and that of fringing fields are taken into account accurately on the basis of the mode-matching analysis.
Begin
2024-01-24
Planned document number
DIN EN IEC 63185
Project number
02232050
Responsible national committee
DKE/UK 412.4 - Passive HF- und Mikrowellenbauelemente
