Project
Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies balanced-type circular disk resonator method
Abstract
This international standard relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method provides conductivity measurements of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. The method utilizes higher-order mode resonances of a balanced-type circular-disk resonator (BCDR) for providing broadband measurements with a single resonator. The document provides information on the theory, equipment, procedures, and applicable range of the method.
Begin
2023-10-18
Planned document number
DIN EN IEC 61169-73
Project number
02231880
