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Project

Surface chemical analysis - Rule sets for automatic retrieval of information from the X-Ray photoelectron spectroscopy survey spectrum - Identification and use of significant minor features in the XPS survey spectrum.

Begin

2024-01-09

Planned document number

ISO/AWI 24689

Responsible national committee

NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy  

Responsible international committee

ISO/TC 201/SC 3 - Data management and treatment  

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

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