Abstract

This document defines a method for the determination of the mass fractions of the elements Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide. Dependent on element, emission lines, plasma conditions and sample mass, this test method is applicable for mass fractions of the above trace contaminations from about 0,1 mg/kg to about 1 000 mg/kg, after evaluation also from 0,001 mg/kg to about 5 000 mg/kg.

Begin

2023-07-14

WI

00187157

Planned document number

DIN EN 15991

Project number

06236567

Responsible national committee

NA 062-02-66 AA - Chemical analysis of ceramic and glass materials  

Responsible european committee

CEN/TC 187/WG 4 - Chemical analysis  

draft standard

Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry with electrothermal vaporisation (ETV-ICP-OES); German and English version prEN 15991:2024
2024-07
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previous edition(s)

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV); German version EN 15991:2015
2016-02

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