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Project

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/1401/CD:2022); Text in German and English

Abstract

This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.

Begin

2022-08-10

Planned document number

DIN EN IEC 62276

Project number

02231143

Responsible national committee

DKE/K 642 - Piezoelektrische Bauteile zur Frequenzstabilisierung und -selektion  

draft standard

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/1401/CD:2022); Text in German and English
2023-05
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previous edition(s)

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016
2017-08

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Contact

Daniel Failer

Merianstr. 28
63069 Offenbach am Main

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