Project
IEC 60749-30 Amend 1 Ed.1: Semiconductor devices - Mechanical and climatic test methods -Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Begin
2009-07-31
Planned document number
IEC 47/2019/CDV
Responsible national committee
DKE/K 631 - Halbleiterbauelemente
