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Project

IEC 60749-29 Ed.2: SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - Part 29: Latch-up test

Begin

2009-09-04

Planned document number

IEC 47/2083/FDIS

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Responsible international committee

IEC/TC 47 - Semiconductor devices  

Contact

Elena Rongen

Merianstr. 28
63069 Offenbach am Main

Tel.: +49 69 6308-429

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