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Standards [CURRENT]

OEVE/OENORM EN 62373
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006)

Title (German)

Stabilitätsprüfung unter Temperatur-Spannungs-Beanspruchung für Feldeffekttransistoren mit Metalloxid-Halbleiter (MOSFET) (IEC 62373:2006)

Edition 2007-03-01
Original language German
Price from 100.28 €
Table of contents