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Standards [CURRENT]

NF C96-022-35 ; NF EN 60749-35:2006-12-01
Semiconductor devices - Mechanical and climatic test methods - Part 35: acoustic microscopy for plastic encapsulated electronic components

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 35: Ultraschallmikroskopie für kunststoffverkappte Bauelemente der Elektronik

Edition 2006-12-01
Original language French
Price from 105.40 €
Table of contents