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Standards [CURRENT]

NF C96-050-3 ; NF EN 62047-3:2006-11-01
Semiconductor devices - Micro-electromechanical devices - Part 3: thin film standard test piece for tensile testing

Title (German)

Halbleiterbauelemente - Bauteile der Mikrosystemtechnik - Teil 3: Dünnschicht-Standardmikroprobe für die Prüfung der Zugbeanspruchung

Edition 2006-11-01
Original language French
Price from 73.40 €
Table of contents