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Standards [CURRENT]

NF C96-022-33 ; NF EN 60749-33:2005-12-01
Semiconductor devices - Mechanical and climatic test methods - Part 33: accelerated moisture resistance - unbiased autoclave

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 33: beschleunigte Verfahren für Feuchtebeständigkeit - Autoclave ohne elektrische Beanspruchung

Edition 2005-12-01
Original language English , French
Price from 73.40 €
Table of contents