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Standards [CURRENT]

OEVE/OENORM EN 60749-2
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure (IEC 60749-2:2002)

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 2: Niedriger Luftdruck (IEC 60749-2:2002)

Edition 2003-10-01
Original language German
Price from 76.61 €
Table of contents