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Standards [CURRENT]

ISO 20341
Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials

Title (German)

Chemische Analytik an Oberflächen - Sekundärionenmassenspektrometrie - Methode für die Bestimmung von Parametern der Tiefenauflösung mit Hilfe von Referenzmaterialien mit mehreren Deltaschichten

Responsible national committee

NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy  

Responsible international committee

ISO/TC 201/SC 6 - Secondary ion mass spectrometry  

Edition 2003-07
Original language English
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Table of contents

Contact

Steffen Jenkel

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