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Standards [CURRENT]

OEVE/OENORM EN 60749+A1+A2
Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996 + A1:2000 + A2:2001)

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren (IEC 60749:1996 + A1:2000 + A2:2001)

Edition 2002-11-01
Original language German
Price from 220.42 €
Table of contents