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Standards [CURRENT]

DIN EN 60747-5-3 ; VDE 0884-3:2003-01
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices; Measuring methods (IEC 60747-5-3:1997 + A1:2002); German version EN 60747-5-3:2001 + A1:2002

Title (German)

Einzel-Halbleiterbauelemente und integrierte Schaltungen - Teil 5-3: Optoelektronische Bauelemente; Messverfahren (IEC 60747-5-3:1997 + A1:2002); Deutsche Fassung EN 60747-5-3:2001 + A1:2002

Document: references other documents

Document: referenced in other documents

Responsible national committee

DKE/UK 631.1 - Einzel-Halbleiterbauelemente

Responsible international committee

IEC/SC 47E - Discrete semiconductor devices

Edition 2003-01

Original language German

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Table of contents

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