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Standards [New]

ISO 20263
Microbeam analysis - Analytical electron microscopy - Method for the determination of interface position in the cross-sectional image of the layered materials

Title (German)

Mikrobereichsanalyse - Analytische Elektronenmikroskopie - Verfahren zur Bestimmung von Grenzschichtpositionen in der Querschnittsaufnahme von mehrschichtigen Materialien

Responsible national committee

NA 062-08-18 AA - Electron microscopy and microbeam analysis  

Responsible international committee

ISO/TC 202/SC 3 - Analytical electron microscopy  

Edition 2024-11
Original language English
Price from 190.80 €
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Table of contents

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Steffen Jenkel

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