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Standards [CURRENT]

DIN EN IEC 60749-5 ; VDE 0884-749-5:2024-09
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2023); German version EN IEC 60749-5:2024

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung (IEC 60749-5:2023); Deutsche Fassung EN IEC 60749-5:2024

Document: references other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 2024-09
Original language German
Price from 41.72 €
Order from DIN Media
Table of contents

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