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Standards [New]

DIN EN IEC 60749-28 ; VDE 0884-749-28:2024-12
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2022); German version EN IEC 60749-28:2022

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Charged Device Model (CDM) - Device Level (IEC 60749-28:2022); Deutsche Fassung EN IEC 60749-28:2022

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 2024-12
Original language German
Price from 100.60 €
Order from DIN Media
Table of contents

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