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Standards [New]

ISO 5861
Surface chemical analysis - X-ray photoelectron spectroscopy - Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments

Title (German)

Chemische Oberflächenanalyse - Röntgenphotoelektronenspektrometrie - Methode der Intensitätskalibrierung für mit Quarzkristallen monochromatisierte Al Kα XPS-Geräte

Responsible national committee

NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy  

Responsible international committee

ISO/TC 201/SC 7/WG 2 - Quantification and interpretation of data in electron spectroscopy  

Edition 2024-06
Original language English
Price from 166.60 €
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Table of contents

Contact

Steffen Jenkel

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