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Draft standard

DIN EN IEC 60749-34-1
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (IEC 47/2759/CD:2022); Text in German and English

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 34-1: Leistungszyklusprüfung für Leistungshalbleitermodule (IEC 47/2759/CD:2022); Text Deutsch und Englisch

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 2024-08
Original language German , English
Price from 106.30 €
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Table of contents

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