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Draft standard

DIN EN IEC 60749-5
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 47/2770/CDV:2022); German and English version prEN IEC 60749-5:2022

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung (IEC 47/2770/CDV:2022); Deutsche und Englische Fassung prEN IEC 60749-5:2022

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 2024-04
Original language German , English
Price from 70.50 €
Order from DIN Media
Table of contents

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