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Standards [CURRENT]

DIN EN IEC 60749-10
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly (IEC 60749-10:2022); German version EN IEC 60749-10:2022

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 10: Mechanischer Schock - Bauelemente und Unterbaugruppe (IEC 60749-10:2022); Deutsche Fassung EN IEC 60749-10:2022

Document: references other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 2023-12
Original language German
Price from 91.80 €
Order from DIN Media
Table of contents

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