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Standards [CURRENT]

BS EN IEC 60749-28
Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level

Title (German)

Halbleiterbauelemente. Mechanische und klimatische Prüfverfahren Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD). Charged Device Model (CDM). Device Level

Edition 2022-09-06
Original language English
Price from 372.60 €
Table of contents