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Standards [CURRENT]

NF C96-022-28 ; NF EN IEC 60749-28:2022-04-08
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Charged Device Model (CDM) - Device Level

Edition 2022-04-08
Original language French
Price from 144.20 €
Table of contents