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Standards [CURRENT]

UNE-EN IEC 60749-28
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in May of 2022.)

Edition 2022-05-01
Original language English
Price from 96.30 €
Table of contents