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Draft standard

OVE EN IEC 60749-28
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 47/2661/CDV) (english version)

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Charged Device Model (CDM) - Device Level (IEC 47/2661/CDV) (englische Fassung)

Edition 2021-01-01
Original language English
Price from 37.20 €
Table of contents