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Standards [CURRENT]

NF C96-022-41 ; NF EN IEC 60749-41:2020-09-04
Semiconductor devices - Mechanical and climatic test methods - Part 41: standard reliability testing methods of non-volatile memory devices

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 41: Standardisierte Prüfverfahren für die Zuverlässigkeit von nichtflüchtigen Speicher-Bauelementen

Edition 2020-09-04
Original language French
Price from 105.40 €
Table of contents