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Standards [CURRENT]

NF C96-022-3 ; NF EN 60749-3:2017-06-16
Semiconductor devices - Mechanical and climatic test methods - Part 3: external visual examination

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 3: Äussere Sichtprüfung

Edition 2017-06-16
Original language French
Price from 73.40 €
Table of contents