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Standards [CURRENT]

ISO 13084
Surface chemical analysis - Secondary ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

Title (German)

Chemische Oberflächenanalyse - Sekundärionen-Massenspektrometrie - Kalibrierung der Massenskale für einen Flugzeit-Sekundärionen-Massenspektrometer

Responsible national committee

NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy

Responsible international committee

ISO/TC 201/SC 6/WG 4 - Organic and Nano SIMS

Edition 2018-11

Original language English

Price from 106.30 €

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Table of contents

PDF (EN)

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

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