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Standards [CURRENT]

SN EN 60749-44
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 44: Prüfverfahren zur Einzelereignis-Effekt-Neutronenbestrahlung von Halbleiterbauelementen

Edition 2016-10
Original language German
Price from 25.80 €
Table of contents