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Standards [CURRENT]

ISO 20411
Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry

Title (German)

Chemische Oberflächenanalyse - Sekundärionenmassenspektroskopie - Korrekturverfahren für gesättigte Intensität bei Einzelionen zählender dynamischer Sekundärionenmassenspektroskopie

Responsible national committee

NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy  

Responsible international committee

ISO/TC 201/SC 6 - Mass spectrometries  

Edition 2018-03
Original language English
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Table of contents

Contact

Steffen Jenkel

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