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Standards [CURRENT]

UNE-EN 60749-27
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006) (Endorsed by AENOR in November of 2006.)

Edition 2006-11-01
Original language English
Price from 63.10 €
Table of contents