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Standards [CURRENT]

NF C96-022-44 ; NF EN 60749-44:2016-12-23
Semiconductor devices - Mechanical and climatic test methods - Part 44: neutron beam irradiated single event effect (SEE) test method for semiconductor devices

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 44: Prüfverfahren zur Einzelereignis-Effekt-Neutronenbestrahlung von Halbleiterbauelementen

Edition 2016-12-23
Original language French
Price from 118.70 €
Table of contents