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Technical rule [CURRENT]

DIN SPEC 91348
Testing crystalline silicon solar cells for susceptibility to potential induced degradation (PID)

Title (German)

Prüfung von kristallinen Silicium-Solarzellen auf die Anfälligkeit für Potential-induzierte Degradation

Procedure

PAS

Overview

This DIN SPEC has been prepared by a workshop (temporary committee) in the course of the PAS procedure. This DIN SPEC has been prepared and adopted by the authors named in the foreword. This DIN SPEC specifies requirements for the test of non-encapsulated crystalline silicon solar cells for potential induced degradation.

Document: references other documents

Edition 2016-11
Original language English
Free Download
Table of contents

Contact

Dipl.-Ing.

So-Jin Kim

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

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Fax: +49 30 2601-42734

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