ISO 19830
Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Chemische Oberflächenanalyse - Elektronenspektroskopien - Mindestanforderungen an die Ausgabe zum Anfitten eines Peaks bei der Röntgenphotoelektronenspektroskopie
Responsible national committee
NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy
Responsible international committee
ISO/TC 201/SC 7/WG 2 - Quantification and interpretation of data in electron spectroscopy