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Standards [CURRENT]

NF C96-050-16 ; NF EN 62047-16:2015-11-14
Semiconductor devices - Micro-electromechanical devices - Part 16: test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods

Title (German)

Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 16: Messverfahren zur Ermittlung der Eigenspannungen in Dünnschichten von MEMS-Bauteilen - Substratkrümmungs- und Biegebalken-Verfahren

Edition 2015-11-14
Original language French
Price from 90.10 €
Table of contents