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Standards [CURRENT]

BS EN 62047-16
Semiconductor devices. Micro-electromechanical devices. Test methods for determining residual stresses of MEMS films Wafer curvature and cantilever beam deflection methods

Title (German)

Halbleiterbauelemente. Bauelemente der Mikrosystemtechnik. Messverfahren zur Ermittlung der Eigenspannungen in Dünnschichten von MEMSBauteilen. Substratkrümmungs- und Biegebalken-Verfahren

Edition 2015-07-31
Original language English
Price from 192.70 €
Table of contents