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Standards [CURRENT]

PD ISO/TR 22335
Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer

Title (German)

Chemische Analytik an Oberflächen. Tiefenprofilanalyse. Messung der Ionenstrahlzerstäubungs-Geschwindigkeit mittels der Gitter-Kopiermethode mit dem mechanischen Stylus Profilometer

Edition 2007-08-31
Original language English
Price from 267.20 €
Table of contents