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Standards [CURRENT]

OEVE/OENORM EN 62047-21
Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson`s ratio of thin film MEMS materials (IEC 62047-21:2014) (german version)

Title (German)

Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 21: Prüfverfahren zur Querkontraktionszahl von Dünnschichtwerkstoffen der Mikrosystemtechnik (IEC 62047-21:2014) (deutsche Fassung)

Edition 2015-06-01
Original language German
Price from 116.88 €
Table of contents