Attention: Your browser doesn't support javascript or you have deactivated Javascript in your browser. Please enable Javascript in your browser in order to be able to use all functions of this website.

Hydrogen Technologies Standards form the basic framework for market ramp-up
More information
Climate change Standards and specifications support climate targets
More information
Smart Farming Standards and specifications are drivers for the digitalization of agriculture
More information

Standards [CURRENT]

ISO 13095
Surface Chemical Analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

Title (German)

Chemische Oberflächenanalyse - Rasterkraftmikroskopie - Verfahren zur in situ-Charakterisierung des Schaftprofils von AFM-Sonden zur Messung von Nanostrukturen

Responsible national committee

NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy

Responsible international committee

ISO/TC 201/SC 9/WG 5 - Calibration of probes

Edition 2014-07

Original language English

Price from 142.50 €

Order from DIN Media

Table of contents

PDF (EN)

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Send message to contact

Economic benefits

DIN SPEC

Why do standards cost money?

Get involved in standardization

Terminology

Hydrogen Technologies Standards form the basic framework for market ramp-up

Climate change Standards and specifications support climate targets

Smart Farming Standards and specifications are drivers for the digitalization of agriculture

ISO 13095 Surface Chemical Analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

Responsible national committee

Responsible international committee

Steffen Jenkel

Want to learn more?

ISO 13095
Surface Chemical Analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement