Overview

Integrated circuits are used in all areas of automation in our world characterized by information technology applications. They are exposed to electromagnetic interference that can cause malfunction, particularly in industrial environments or when used in vehicles. Electrical transients are a normal part of the EMC environment of electrical and electronic components. These transients are often generated in energy networks and directly fed into or coupled into the IC terminals and can therefore influence the function of the component. Knowledge of the immunity level with regard to impulses enables optimization of the IC and specification of the application requirements. This document specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range. The responsible committee is DKE/K 631 "Halbleiterbaulemente" ("Semiconductor devices") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.

Document: references other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente