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Standards [CURRENT]

NF C96-050-13 ; NF EN 62047-13:2012-12-01
Semiconductor devices - Micro-electromechanical devices - Part 13: bend- and shear- type test methods of measuring adhesive strenght for MEMS structures

Title (German)

Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 13: Biege- und Scherprüfverfahren zur Messung der Haftfestigkeit bei MEMS-Strukturen

Edition 2012-12-01
Original language French
Price from 90.10 €
Table of contents