DIN EN 62132-8
; VDE 0847-22-8:2013-03
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (IEC 62132-8:2012); German version EN 62132-8:2012
Integrierte Schaltungen - Messung der elektromagnetischen Störfestigkeit - Teil 8: Messung der Störfestigkeit bei Einstrahlungen - IC-Streifenleiterverfahren (IEC 62132-8:2012); Deutsche Fassung EN 62132-8:2012
Overview
The IC Stripline offers a broadband method of measuring either immunity of a DUT to fields generated within the IC Stripline or radiated emission from a DUT placed within the IC Stripline. It eliminates the use of conventional antennas with their inherent measurement limitations of bandwidth, non-linear phase, directivity and polarization. The IC Stripline is a special kind of transmission line that propagates a TEM wave. This wave is characterized by transverse orthogonal electric (E) and magnetic (H) fields, which are perpendicular to the direction of propagation along the length of the IC Stripline or transmission line. This standard series DIN EN 62132 defines a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz. For this purpose the IC to be evaluated should be mounted on an EMC test board (PCB) provided with the appropriate measurement or monitoring points at which the DUT response parameters can be measured. The EMC test board controls the geometry and orientation of the DUT relative to the active conductor and eliminates in case of a closed version of the IC Stripline any connecting leads within the housing. In principle there are two possible versions of the IC Stripline - an open and a closed version. For the open version a simple stripline arrangement is used. For the closed version an additional shielding enclosure is applied. The standard describes corresponding arrangements. This part of DIN EN 62132 shall be applied in conjunction with DIN EN 62132-1. Future standards of this series have the new indicated general title and are incorporated as measurement instructions for EMC into the corresponding series with VDE classification 0847-22. The titles of the existing standards of this series are updated with their next edition and they are then also incorporated together with the VDE classification 0847-22 into the VDE body of regulations. The responsible committee is DKE/K 631 "Halbleiterbauelemente" ("Semiconductor devices") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.
