DIN EN 61788-15
; VDE 0390-15:2012-08
Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies (IEC 61788-15:2011); German version EN 61788-15:2011
Supraleitfähigkeit - Teil 15: Messungen der elektronischen Charakteristik - Oberflächenimpedanz von Supraleiterschichten bei Mikrowellenfrequenzen (IEC 61788-15:2011); Deutsche Fassung EN 61788-15:2011
Overview
This part of IEC 61788 describes measurements of the intrinsic surface impedance (ZS) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic ZS at the resonant frequency. The frequency and thickness range and the measurement resolution for the intrinsic ZS of HTS films are as follows: - frequency: up to 40 GHz; - measurement resolution: 0,01 mΩ at 10 GHz. The intrinsic ZS data at the measured frequency, and that scaled to 10 GHz, assuming the f2 rule for the intrinsic surface resistance RS (f < 50 GHz) and the f rule for the intrinsic surface reactance XS for comparison, shall be reported. The responsible committee is K 184 "Supraleiter" ("Superconductors") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.
