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Standards [CURRENT]

NF C96-022-40 ; NF EN 60749-40:2012-02-01
Semiconductor devices - Mechanical and climatic test methods - Part 40: board level drop test method using a strain gauge

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Prüfverfahren zum Fall einer Leiterplatte unter Verwendung von Dehnungsmessstreifen

Edition 2012-02-01
Original language French
Price from 105.40 €
Table of contents