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Standards [CURRENT]

BS EN 60749-40
Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using a strain gauge

Title (German)

Halbleiterbauelemente. Mechanische und klimatische Prüfverfahren. Prüfverfahren zum Fall einer Leiterplatte unter Verwendung von Dehnungsmessstreifen

Edition 2011-09-30
Original language English
Price from 267.20 €
Table of contents